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October 8, 1973

Scanning Electron Microscopy/1973

JAMA. 1973;226(2):207. doi:10.1001/jama.1973.03230020049033

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Scanning electron microscopy (SEM), invented 20 years ago, primarily gives three-dimensional surface details on a screen or photograph at magnifications comparable to a transmission electron microscope (TEM). Scanning electron microscopy may in time replace TEM, since excellent transmission micrographs can now be made with SEM. An outstanding technical feature is the fact that SEM gives off several secondary rays, the most important being xrays, which are used in the nondestructive chemical analysis of biological specimens, metals, or paints, even of material less than 1,000 angstroms (1/10,000th mm) in size.

This book is remarkable in several ways. It includes general, technical, and pathology sections, and has 90 excellently illustrated reports—each accompanied by questions submitted by two reviewers and answers by the authors. A complete bibliography is included. The editors have accomplished a remarkable feat by publishing this book in the space of two months; each person attending the symposium received the