[Skip to Content]
Access to paid content on this site is currently suspended due to excessive activity being detected from your IP address 54.163.147.69. Please contact the publisher to request reinstatement.
[Skip to Content Landing]
Article
October 8, 1973

Scanning Electron Microscopy/1973

Author Affiliations

Chicago

 

edited by Om Johari and Irene Corvin (symposium, April 1973, Chicago), 789 pp, with illus, $20, IIT Research Institute (10 W 35, Chicago 60616), 1973.

JAMA. 1973;226(2):207. doi:10.1001/jama.1973.03230020049033

This article is only available in the PDF format. Download the PDF to view the article, as well as its associated figures and tables.

Abstract

Scanning electron microscopy (SEM), invented 20 years ago, primarily gives three-dimensional surface details on a screen or photograph at magnifications comparable to a transmission electron microscope (TEM). Scanning electron microscopy may in time replace TEM, since excellent transmission micrographs can now be made with SEM. An outstanding technical feature is the fact that SEM gives off several secondary rays, the most important being xrays, which are used in the nondestructive chemical analysis of biological specimens, metals, or paints, even of material less than 1,000 angstroms (1/10,000th mm) in size.

This book is remarkable in several ways. It includes general, technical, and pathology sections, and has 90 excellently illustrated reports—each accompanied by questions submitted by two reviewers and answers by the authors. A complete bibliography is included. The editors have accomplished a remarkable feat by publishing this book in the space of two months; each person attending the symposium received the

×