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Specialists Certified by the American Board of Dermatology and Syphilology.—
At the last meeting of the American Board of Dermatology and Syphilology, held in Detroit, October 20 to 22, 1950, the following candidates were found proficient and are now certified specialists: Jack J. Albom, New Haven, Conn.; Samuel D. Allison, Honolulu, T. H.; Harry Arons, Newark, N. J.; Sam C. Atkinson Jr., Summit, N. J.; John H. Barthell, Lincoln, Neb.; Sigmund J. Clayman, New York; Hugh M. Crumay, Philadelphia; Frank X. Dwyer, Kansas City, Mo.; George Gaethe, New Orleans; Calvin B. Galloway, Camp Lejeune, N. C.; Frederick C. Grieshaber, New Orleans; Edward F. Gudgel, Kenmore, N. Y.; Arthur E. Gulick, Detroit; Milton H. Gustafson, Muncie, Ind.; Milton E. Helman, Chelsea, Mass.; Edwin N. Hesbacher, Richmond, Va.; Edwin L. Higgins, Covington, Ky.; Elmer M. Hill, Minneapolis; Frank C. Hoak, Buffalo; Sidney Hoffman, Brooklyn; Samuel Holtzman, Chicago; Wilbur B. Hurlbut,
News and Comment. AMA Arch Derm Syphilol. 1951;63(1):167. doi:10.1001/archderm.1951.01570010170019